Equipment

EPR spectroscopy is also available in our lab.

Dielectric spectroscopy:

Frequency domain:

Solartron 1250 Response analyser + Solartron 1296 Dielectric interface, 10 μHz – 60 kHz;
HP 4284A precision LCR meter, 20 Hz – 1 MHz;
Agilent 8714ET vector network analyser, 300 kHz – 3 GHz;
Agilent E8363B vector network analyser, 10 MHz – 40 GHz;
Agilent N2257 vector network analyser + N5261A Probe Head Controller, 10 MHz – 110 GHz;
Elmika 2400 scalar network analysers with waveguides (8 – 12, 27 – 40, 35 – 55 GHz ranges);
Elmika 2400 scalar network analyser equipped with 6-port custom-made waveguide-setup, allowing vector reflection coefficient measurements in 80 – 120 GHz range.
Teravil Fourier THz spectrometer (100 – 3000 GHz)
Bruker Vertex 80V (10 – 25000 cm-1, or 300 GHz – 750 THz)

Temperature domain:

Custom-made thermostates: 110 – 500 K;
Closed-cycle Helium cryostate with Lakeshore 331: 6 – 300 K;
SNOL furnace: 300 – 1000 K.

Thin and thick film characterization equipment TF Analyzer 2000 (aixACCT). Options:
Single beam laser interferometer (d33)
up to 250 °C (thin films) with up to 25 V voltage swing
e31 4-point measurement (thin films)
from -100 °C to 600 °C (bulk samples) with up to 4 kV voltage swing

Matavimu spektras mazas

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